Scientists have achieved a groundbreaking milestone by successfully detecting the X-ray signature of a single atom using a novel technique called synchrotron X-ray scanning tunneling microscopy (SX-STM). This advancement, spearheaded by a team from Ohio University, Argonne National Laboratory, and the University of Illinois-Chicago, allows for the detailed characterization of individual atoms, which could significantly impact fields such as environmental science, medicine, and quantum research. The project, funded by the U.S. Department of Energy, was driven by the vision of researchers, including Saw Wai Hla, to X-ray single atoms—something previously deemed challenging due to the weak X-ray signals emitted by individual atoms.
In their research, the team focused on detecting iron and terbium atoms within respective molecular structures. They utilized specialized detectors, enhancing conventional methods, to gather X-ray excited electrons. This innovative approach permits not only identification of elemental types but also assessment of their chemical states. As a result, scientists can now manipulate and explore the properties of individual atoms more effectively. This study, published in Nature, signifies a leap forward in materials science and adds new dimensions to research in quantum and spin properties, fostering future technological advancements.
